THE EFFECT OF ANNEALING TEMPERATURE ON PROPERTIES OF PZT CERAMIC FILMS PREPARED VIA SPIN-COATING PROCESS

Authors

  • Marut Khieokae Lecturer, Department of Industrial Technology, Faculty of Technical Education, Rajamangala University of Technology Krungthep, 2 Nang linchi Road, Tungmahamek, Sathon, Bangkok 10120
  • Kanut Jinpak Lecturer, Department of Industrial Technology, Faculty of Technical Education, Rajamangala University of Technology Krungthep, 2 Nang linchi Road, Tungmahamek, Sathon, Bangkok 10120
  • Suphattra Kritwattanakorn Lecturer, Department of Industrial Technology, Faculty of Technical Education, Rajamangala University of Technology Krungthep, 2 Nang linchi Road, Tungmahamek, Sathon, Bangkok 10120
  • Suwimol Jairtalawanich Lecturer, Department of Industrial Technology, Faculty of Technical Education, Rajamangala University of Technology Krungthep, 2 Nang linchi Road, Tungmahamek, Sathon, Bangkok 10120
  • Tinno Kwandee Lecturer, Department of Industrial Technology, Faculty of Technical Education, Rajamangala University of Technology Krungthep, 2 Nang linchi Road, Tungmahamek, Sathon, Bangkok 10120
  • Pichitchai Butnoi Lecturer, Department of Industrial Technology, Faculty of Technical Education, Rajamangala University of Technology Krungthep, 2 Nang linchi Road, Tungmahamek, Sathon, Bangkok 10120

Keywords:

PZT ceramic films, Spin-coating, annealing temperature, AFM

Abstract

In this work, lead zirconate titanate Pb(Zr0.52Ti0.48)O3 or PZT films under 20% mol of Pb-excess were fabricated on Ti/SiO2/Si wafer by spin-coating method. The PZT films were annealed at different temperatures of 550, 600 and 650 ̊C for 30 min under atmosphere. The effects of annealing temperature on microstructure, surface morphology and phase formation of PZT ceramic films were investigated by Field-emission scanning electron microscope (FE-SEM), Atomic force microscopy (AFM) and X-ray diffraction (XRD), respectively. The PZT ceramic films exhibited perovskite phase that crystallographic orientations increased with increasing annealing temperatures. Moreover, the average grain sizes and film thickness slightly increased with increasing annealing temperatures.

References

Trolier-McKinstry S, Muralt P. Thin film piezoelectrics for MEMS. In: Setter N, editor. Electroceramic-based MEMS: fabrication-technology and applications. Boston, MA: Springer US; 2005. p. 199-215.

Yu HG, Zou L, Deng K, Wolf R, Tadigadapa S, Trolier-McKinstry S. Lead zirconate titanate MEMS accelerometer using interdigitated electrodes. Sensors and Actuators, A: Physical 2003;107(1):26-35.

Cui Y, Zhang Q, Yao M, Dong W, Gao S. Vibration piezoelectric energy harvester with multi-beam. AIP Advances 2015;5:41332.

Butnoi P, Pisitpipathsin N, Kantha P, Bintachitt P, Pengpat K. Phase transition and dielectric properties of PNNZT-BNLT ceramics. Ferroelectrics. 2013;452(1):1-6.

Garbacz H, Wieciński P, Kuczyńska D, Kubacka D, Kurzydłowski KJ. The effect of grain size on the surface properties of titanium grade 2 after different treatments. Surface and Coatings Technology 2018;335:13-24.

Periyannan J, Muniyandi M, Venkatesan GN. Effect of thickness and annealing temperature on the properties of PZT films at morphotropic phase boundary composition prepared by sol-gel spin-on technique. Advanced Materials Research 2014;895:17-20.

Ma Y, Song J, Wang X, Liu Y, Zhou J. Synthesis, microstructure and properties of magnetron sputtered lead zirconate titanate (Pzt) thin film coatings. Coatings 2021;11(8):944.

Li J, Yuan N, Li K, Tong KY, Chan HL-W. Properties of sol-gel PZT films based on indium-tin oxide substrate. Ferroelectrics 2001;260(1):189-94.

Simon L, Le Dren S, Gonnard P. PZT and PT screen-printed thick films. Journal of the European Ceramic Society 2001;21(10):1441-4.

Shakeri A, Abdizadeh H, Golobostanfard MR. Synthesis and characterization of thick PZT films via sol–gel dip coating method. Applied Surface Science 2014;314:711-9.

Chen B, Wu L, Chure M, Chen Y. Fabrication of PZT BY sol-gel method. In: Proceedings of the 2010 Symposium on Piezoelectricity, Acoustic Waves and Device Applications. 2010. p. 310–4.

Zhang JX, Hoshino K. Chapter 2 - Fundamentals of nano/microfabrication and scale effect. In: Zhang JX, Hoshino K, editors. Molecular Sensors and Nanodevices 2nd edition. Elsevier; 2019. p. 43–111.

Maziati Akmal MH, Warikh ARM, Azlan UAA, Azmi NA. The effects of different annealing temperatures and number of deposition layers on the crystallographic properties sodium niobate (KNN) thin films synthesized by sol-gel spin coating technique. Journal of Advanced Manufacturing Technology 2017;11(1):91-102

Kwoka M, Lyson-Sypien B, Comini E, Krzywiecki M, Waczynski K, Szuber J. Surface properties of SnO2 nanolayers prepared by spin-coating and thermal oxidation. Nanotechnology 2020;31(31):315714.

Fu D, Ishikawa K, Yoshimi Y, Suzuki H. Long-Time Piezoelectric Relaxation in Lead Zirconate Titanate Thin Film. Japanese Journal of Applied Physics 2002;41:580-2.

Godard N, Grysan P, Defay E, Glinšek S. Growth of {100}-oriented lead zirconate titanate thin films mediated by a safe solvent. Journal of Materials Chemistry C 2021;9(1):281–7.

Mohd Arif NAA, Jiun CC, Shaari S. Effect of annealing temperature and spin coating speed on Mn-Doped ZnS nanocrystals thin film by spin coating. Journal of Nanomaterials 2017:2560436.

Scriven LE. Physics and Applications of DIP Coating and Spin Coating. MRS Online Proceeding Library 1988;121(1):717–29.

Nguyen K, Bellec E, Zatterin E, Le Rhun G, Gergaud P, Vaxelaire N. Structural insights of electrical aging in PZT thin films as revealed by in situ biasing X-ray diffraction. Materials 2021;14(16):4500.

Butnoi P, Intawin P, Yongsiri P, Pisitpipathsin N, Pengpad P, Bintachitt P, et al. Effect of BCZT dopant on ferroelectric properties of PZT ceramics. Key Engineering Materials2016;675-676:509-12.

Kim B-N, Hiraga K, Morita K, Chen I-W. Rate of creep due to grain-boundary diffusion in polycrystalline solids with grain-size distribution. Philosophical Magazine 2005; 85(20):2281-92.

Zhu Y, Ren T, Zhang N, Liu L, Li Z. Effect of annealing temperature on properties of sputtered PZT thin films. Integrated Ferroelectrics 2007;90(1):3-11.

Downloads

Published

2023-04-29

Issue

Section

บทความวิจัย (Research Article)