Improvement of Optical Transceiver Testing Process in Electronics Industry

Abstract

The objective of this research is to improve testing process of optical transceiver in order toprevent dust and scratch on lens by applying six sigma approaches consisting of 5 phases - Define phase,Measure phase, Analysis phase, Improve phase and Control phase. Based on the result of studying, it wasfounded 3 main models have shown the low yield - average about 88.9%. There is equal to the cost of defectsaround 14,000 $ per month. In this regard, one has been selected from 3 main models to study. Importantly,the methodologies to screen factors comprise Failure Mode and Effect Analysis, Cause and Effect Diagramtechniques and Reliability Theory. Accordingly, the factors which affect significantly to the testing process areboth dust and scratch on lens occurred from fiber cleaning method and dust from LC holder. Yield of testingprocess after implementation have been improved significantly from 84.49% to 93.06%, which is equivalenceto the cost of defect reducing from 17,000$ to 7,500$ per month , approximately cost saving 55.88% per month.