The Noncontact Atomic Force Microscopy Model (NC-AFM)

Abstract

Modeling a noncontact atomic force microscope (NC-AFM) to enhance the college students’ understanding of how the AFM operates. The model introduces the students’ comprehension of how to use the nanotechnology tool for research. The NC-AFM senses nanoparticles by measuring Van der Waals interactions (strong force) which will happen at the atomic scale for evaluating properties and manipulating nanoparticles.