Boonma, K., and S. . . klongboonjit. “The Application of Employing the Discriminant Analysis Technique to Forecast the Inspection Marking on the Integrated Circuit Product”. Engineering and Technology Horizons, vol. 39, no. 1, Mar. 2022, pp. 63-75, https://ph01.tci-thaijo.org/index.php/lej/article/view/245799.