Ruangphanit, A., R. Muanghlua, and Y. Wongprasert. “Effect and Determination of Oxide Trapped Charge and Interface Trapped Charge Density of Threshold Voltage Shift in Irradiated MOSFET by Subthreshold Methodology”. Engineering and Technology Horizons, vol. 40, no. 4, Dec. 2023, p. 400409, doi:10.55003/ETH.400409.