A. Ruangphanit, R. Muanghlua, and Y. Wongprasert, “Effect and Determination of Oxide Trapped Charge and Interface Trapped Charge Density of Threshold Voltage Shift in Irradiated MOSFET by Subthreshold Methodology”, Eng. & Technol. Horiz., vol. 40, no. 4, p. 400409, Dec. 2023.