Boonma, K. and klongboonjit, S. . . (2022) “The Application of Employing the Discriminant Analysis Technique to Forecast the Inspection Marking on the Integrated Circuit Product”, Engineering and Technology Horizons , 39(1), pp. 63–75. Available at: https://ph01.tci-thaijo.org/index.php/lej/article/view/245799 (Accessed: 18 May 2024).