BOONMA, K.; KLONGBOONJIT, S. . . The Application of Employing the Discriminant Analysis Technique to Forecast the Inspection Marking on the Integrated Circuit Product. Engineering and Technology Horizons , [S. l.], v. 39, n. 1, p. 63–75, 2022. Disponível em: https://ph01.tci-thaijo.org/index.php/lej/article/view/245799. Acesso em: 18 may. 2024.