KATEMUKDA, N. Regression Analysis Applying for Defection Rescreening of Microelectronics Product. Engineering and Technology Horizons , [S. l.], v. 38, n. 4, p. 42–50, 2021. Disponível em: https://ph01.tci-thaijo.org/index.php/lej/article/view/245166. Acesso em: 3 may. 2024.