Wutimakun, Passapong, Kaman Chaivanich, Theerachol Mahawan, Thongkam Chumpol, Chumpol Buteprongjit, and Winat Intarasuwan. “Studies on Defect Detection and Thermal Influence in SiC Substrates Using an IR Thermal Imaging Camera”. Frontiers in Engineering Innovation Research 2 (December 30, 2011): 61–67. accessed September 4, 2026. https://ph01.tci-thaijo.org/index.php/jermutt/article/view/242137.