Wutimakun, P., K. Chaivanich, T. Mahawan, T. Chumpol, C. Buteprongjit, and W. Intarasuwan. “Studies on Defect Detection and Thermal Influence in SiC Substrates Using an IR Thermal Imaging Camera”. Frontiers in Engineering Innovation Research, vol. 2, Dec. 2011, pp. 61-67, https://ph01.tci-thaijo.org/index.php/jermutt/article/view/242137.