Wutimakun, P. ., Chaivanich, K. ., Mahawan, T. ., Chumpol, T. ., Buteprongjit, C. . and Intarasuwan, W. (2011) “Studies on Defect Detection and Thermal Influence in SiC Substrates Using an IR Thermal Imaging Camera”, Journal of Engineering, RMUTT, 2, pp. 61–67. Available at: https://ph01.tci-thaijo.org/index.php/jermutt/article/view/242137 (Accessed: 8 May 2024).