Wutimakun, P., Chaivanich, K., Mahawan, T., Chumpol, T., Buteprongjit, C., & Intarasuwan, W. (2011). Studies on Defect Detection and Thermal Influence in SiC Substrates Using an IR Thermal Imaging Camera. Frontiers in Engineering Innovation Research, 2, 61–67. retrieved from https://ph01.tci-thaijo.org/index.php/jermutt/article/view/242137