Wutimakun, P., Chaivanich, K., Mahawan, T., Chumpol, T., Buteprongjit, C. and Intarasuwan, W. 2011. Studies on Defect Detection and Thermal Influence in SiC Substrates Using an IR Thermal Imaging Camera. Frontiers in Engineering Innovation Research. 2, (Dec. 2011), 61–67.