Banchuin R, Chaisricharoen R. Probabilistic Modelling of Variation in FGMOSFET. ECTI-CIT Transactions [Internet]. 2017 Jun. 8 [cited 2024 May 3];11(1):50-62. Available from: https://ph01.tci-thaijo.org/index.php/ecticit/article/view/63429