SAINON, S.; SA-NGIAMSAK, C. Effects of TiO2 capping layer on reset current of lateral phase change memory. ECTI Transactions on Computer and Information Technology (ECTI-CIT), [S. l.], v. 8, n. 2, p. 145–151, 2016. DOI: 10.37936/ecti-cit.201482.54396. Disponível em: https://ph01.tci-thaijo.org/index.php/ecticit/article/view/54396. Acesso em: 4 may. 2024.