Sainon, S. and Sa-ngiamsak, C. 2016. Effects of TiO2 capping layer on reset current of lateral phase change memory. ECTI Transactions on Computer and Information Technology (ECTI-CIT). 8, 2 (Apr. 2016), 145–151. DOI:https://doi.org/10.37936/ecti-cit.201482.54396.